Keyword:automatic test generation

Publications
Differential Analysis of X86-64 Instruction Decoders William Woodruff, Niki Carroll and Sebastiaan Peters EasyChair Preprint 5095
Automatic generation of high quality test sets via CBMC Emanuele Di Rosa, Enrico Giunchiglia, Massimo Narizzano, Gabriele Palma and Alessandra Puddu In:VERIFY-2010. 6th International Verification Workshop